Fringe-pattern projection (FPP) techniques are widely used for surface-shape measurement in a wide range of applications like object and scene modeling, part inspection, and reverse engineering. This thesis presents a way to increase the accuracy of FPP and also two ways to accurately perform gamma correction for any projector. The Fringe projection profilometer is build using two projectors and one camera. Although Fringe-pattern projection techniques have been researched in various ways, we are proposing using two projectors which would solve the problem of self-occluding shadows due to discontinuities are solved efficiently. This system can accurately measure a surface which has various applications especially in additive manufacturing, where material is deposited layer by layer and this system can accurately monitor how much material is being deposited in the focused area. A crucial challenge while using projectors in Fringe Projection profilometer is gamma non-linearity, two ways of calibrating the gamma and correcting them have been introduced. This problem is quite common with displays and projectors where the gamma value is modified and used for general purposes, but it is not ideal to use for measurement techniques.