Freeform optics offer significant advantages over the conventional aspheric optics, but pose new challenges in metrology and manufacturing. The spatial frequencies of an optical surface that must be measured have changed due to the progression of the manufacturing processes. Unlike aspheres or elements of conventional optical systems, surface prescriptions of freeform optics do not define an optical axis. Therefore, coordinate systems for the freeforms must be established with respect to the fiducials and datums, which must be realizable at all stages of manufacturing. Concurrent engineering suggests that optical designers consider "design for metrology" with fabricators and metrologists to engage during the earlier stages of design. Multiple metrology methods applicable to freeform optics exist, however there are no standardized descriptions of their capabilities. In this thesis is one approach to providing "design for metrology" data that allows for intercomparing alternate metrology methods and for characterizing the performance of metrology instruments with respect to freeform optics.