Search results

  • CSV Spreadsheet
  • RSS Feed
(1 - 8 of 8)
Absolute Surface Reconstruction by Slope Metrology and Photogrammetry
Title
Absolute Surface Reconstruction by Slope Metrology and Photogrammetry
Author
Dong, Yue
Date Created
2014
Subjects--Topical
Optics
Description
Developing the manufacture of aspheric and freeform optical elements requires an advanced metrology method which is capable of inspecting these elements with arbitrary freeform surfaces. In this dissertation, a new surface measurement scheme is in...
FREEFORM MEASUREMENT WITH STITCHING TALBOT INTERFEROMETER
Title
FREEFORM MEASUREMENT WITH STITCHING TALBOT INTERFEROMETER
Author
Furukawa, Yasunori
Date Created
2018
Subjects--Topical
Optics
Description
Freeform optics are being used in many fields to realize the outstanding performance due to their high degree of freedom. To realize sufficiently high performance, it is necessary to manufacture the freeform surface with high accuracy, which requi...
Optical surface characterization with the structure function
Title
Optical surface characterization with the structure function
Author
He, Liangyu
Date Created
2013
Subjects--Topical
Mechanical engineering, Optics
Description
It is important to characterize surface and transmitted wavefront errors in terms of the spatial content. The errors are typically analyzed in three spatial domains: figure, ripple (or mid-spatial frequency) and roughness. These errors can affect ...
MID-SPATIAL FREQUENCY CHARACTERIZATION AND SPECIFICATION FOR FREEFORM SURFACES USING ZERNIKE POLYNOMIALS
Title
MID-SPATIAL FREQUENCY CHARACTERIZATION AND SPECIFICATION FOR FREEFORM SURFACES USING ZERNIKE POLYNOMIALS
Author
Hosseinimakarem, Zahra
Date Created
2017
Subjects--Topical
Optics, Engineering
Description
Mid-spatial frequency on freeform optical elements induces small-angle scatter and affects the optical performance. Fabrication techniques involved in making freeform surfaces leave tooling marks on the surface due to the sub-aperture nature of th...
INTERFEROMETRIC TECHNIQUE FOR MICROSTRUCTURE METROLOGY USING AN INDEX MATCHING LIQUID
Title
INTERFEROMETRIC TECHNIQUE FOR MICROSTRUCTURE METROLOGY USING AN INDEX MATCHING LIQUID
Author
Purcell, Daryl
Date Created
2010
Subjects--Topical
Optics
Description
Non-null interferometry offers a viable alternative to traditional interferometric testing of aspheric micro-lenses since computer generated holograms or null optics whose fabrication and testing are very expensive, are not required. However, due ...
ABSOLUTE DISTANCE (THICKNESS) METROLOGY USING WAVELENGTH SCANNING INTERFEROMETRY
Title
ABSOLUTE DISTANCE (THICKNESS) METROLOGY USING WAVELENGTH SCANNING INTERFEROMETRY
Author
Suratkar, Amit
Date Created
2009
Subjects--Topical
Optics, Optical engineering, Metrology
Description
Wavelength scanning interferometry offers a new dimension in precision metrology by measuring the cavity length (thickness), the cavity length variation over the cavity area (flatness), and the optical homogeneity within a transparent cavity; with...
In Situ Fringe Projection Profilometry for Laser Powder Bed Fusion Process
Title
In Situ Fringe Projection Profilometry for Laser Powder Bed Fusion Process
Author
Zhang, Bin
Date Created
2017
Subjects--Topical
Mechanical engineering, Optics, Engineering
Description
Additive manufacturing (AM) offers an industrial solution to produce parts with complex geometries and internal structures that conventional manufacturing techniques cannot produce. However, current metal additive process, particularly the laser p...
Calibrating slope-dependent errors in profilometry
Title
Calibrating slope-dependent errors in profilometry
Author
Zhou, Yue
Date Created
2014
Subjects--Topical
Mechanical engineering, Optics
Description
Optical profilometers, such as scanning white light interferometers and confocal microscopes, provide high resolution measurements and are widely utilized in many fields for measuring surface topography. The techniques are capable of high-speed su...