Search results
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Title
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Absolute Surface Reconstruction by Slope Metrology and Photogrammetry
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Author
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Dong, Yue
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Date Created
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2014
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Subjects--Topical
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Optics
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Description
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Developing the manufacture of aspheric and freeform optical elements requires an advanced metrology method which is capable of inspecting these elements with arbitrary freeform surfaces. In this dissertation, a new surface measurement scheme is in...
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Title
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Calibrating slope-dependent errors in profilometry
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Author
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Zhou, Yue
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Date Created
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2014
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Subjects--Topical
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Mechanical engineering, Optics
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Description
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Optical profilometers, such as scanning white light interferometers and confocal microscopes, provide high resolution measurements and are widely utilized in many fields for measuring surface topography. The techniques are capable of high-speed su...
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Title
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FREEFORM MEASUREMENT WITH STITCHING TALBOT INTERFEROMETER
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Author
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Furukawa, Yasunori
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Date Created
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2018
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Subjects--Topical
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Optics
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Description
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Freeform optics are being used in many fields to realize the outstanding performance due to their high degree of freedom. To realize sufficiently high performance, it is necessary to manufacture the freeform surface with high accuracy, which requi...
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Title
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In Situ Fringe Projection Profilometry for Laser Powder Bed Fusion Process
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Author
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Zhang, Bin
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Date Created
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2017
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Subjects--Topical
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Mechanical engineering, Optics, Engineering
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Description
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Additive manufacturing (AM) offers an industrial solution to produce parts with complex geometries and internal structures that conventional manufacturing techniques cannot produce. However, current metal additive process, particularly the laser p...
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Title
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Optical surface characterization with the structure function
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Author
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He, Liangyu
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Date Created
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2013
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Subjects--Topical
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Mechanical engineering, Optics
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Description
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It is important to characterize surface and transmitted wavefront errors in terms of the spatial content. The errors are typically analyzed in three spatial domains: figure, ripple (or mid-spatial frequency) and roughness. These errors can affect ...