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(1 - 7 of 7)
ABSOLUTE DISTANCE (THICKNESS) METROLOGY USING WAVELENGTH SCANNING INTERFEROMETRY
Absolute Surface Reconstruction by Slope Metrology and Photogrammetry
Calibrating slope-dependent errors in profilometry
FREEFORM MEASUREMENT WITH STITCHING TALBOT INTERFEROMETER
INTERFEROMETRIC TECHNIQUE FOR MICROSTRUCTURE METROLOGY USING AN INDEX MATCHING LIQUID
In Situ Fringe Projection Profilometry for Laser Powder Bed Fusion Process
Optical surface characterization with the structure function