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Analysis of failure mechanisms that impact safe Operation of AlGaN/GaN HEMTs
Title
Analysis of failure mechanisms that impact safe Operation of AlGaN/GaN HEMTs
Author
Hodge, Michael
Date Created
2014
Subjects--Topical
Electrical engineering
Description
The reliability of AlGaN/GaN high electron mobility transistors (HEMTs) is traditionally determined via thermal lifetime acceleration stress tests. More recently it has been proposed that electric field has a prominent role in limiting lifetimes. ...
POLYDYNE DISPLACEMENT INTERFEROMETER USING FREQUENCY-MODULATED LIGHT
Title
POLYDYNE DISPLACEMENT INTERFEROMETER USING FREQUENCY-MODULATED LIGHT
Author
Arablu, Masoud
Date Created
2019
Subjects--Topical
Mechanical engineering, Electrical engineering, Optics
Description
A novel multi-frequency (polydyne) optical interferometry method is introduced and a prototype developed to evaluate its performance in a Michelson displacement interferometer configuration. The polydyne interferometer contains three main parts of...
Thermal Management and Electromechanical Noise Suppression in a Portable Josephson Junction Voltage Standard.
Title
Thermal Management and Electromechanical Noise Suppression in a Portable Josephson Junction Voltage Standard.
Author
Singh, Namit
Date Created
2012
Subjects--Topical
Mechanical engineering, Electrical engineering
Description
A self-contained, fully portable, Josephson junction voltage reference standard system has been designed, developed and tested. The system relies on an active, closed-cycle refrigerator (CCR) cryocooler system and completely eliminates the relianc...