Search results
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Title
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ABSOLUTE DISTANCE (THICKNESS) METROLOGY USING WAVELENGTH SCANNING INTERFEROMETRY
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Author
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Suratkar, Amit
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Date Created
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2009
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Subjects--Topical
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Optics, Optical engineering, Metrology
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Description
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Wavelength scanning interferometry offers a new dimension in precision metrology by measuring the cavity length (thickness), the cavity length variation over the cavity area (flatness), and the optical homogeneity within a transparent cavity; with...
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Title
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Effects of Edge Roughness on Optical Scattering from Periodic Microstructures
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Author
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Bergner, Brent
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Date Created
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2009
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Subjects--Topical
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Optics, Nanotechnology
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Description
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Planar photonic crystals and other microstructured surfaces have important applications in a number of emerging technologies. However, these structures can be difficult to fabricate in a consistent manner. Rapid, precise measurements of critical p...
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Title
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DEVELOPMENT OF A VERSATILE HIGH SPEED NANOMETER LEVEL SCANNING MULTI-PROBE MICROSCOPE
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Author
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Lin, Feilong
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Date Created
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2011
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Subjects--Topical
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Mechanical engineering, Engineering
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Description
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The motivation for development of a multi-probe scanning microscope, presented in this dissertation, is to provide a versatile measurement tool mainly targeted for biological studies, especially on the mechanical and structural properties of an in...
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Title
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COMPRESSIVE IMAGING AND DUAL MOIRÉ LASER INTERFEROMETER AS METROLOGY TOOLS
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Author
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Abolbashari, Mehrdad
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Date Created
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2013
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Subjects--Topical
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Optics, Engineering
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Description
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Metrology is the science of measurement and deals with measuring different physical aspects of objects. In this research the focus has been on two basic problems that metrologists encounter. The first problem is the trade-off between the range of ...
