Search results

  • CSV Spreadsheet
  • RSS Feed
(1 - 5 of 5)
ABSOLUTE DISTANCE (THICKNESS) METROLOGY USING WAVELENGTH SCANNING INTERFEROMETRY
COMPRESSIVE IMAGING AND DUAL MOIRÉ LASER INTERFEROMETER AS METROLOGY TOOLS
DEVELOPMENT OF A VERSATILE HIGH SPEED NANOMETER LEVEL SCANNING MULTI-PROBE MICROSCOPE
Effects of Edge Roughness on Optical Scattering from Periodic Microstructures
Intracellular Subsurface Imaging Using a Hybrid Shear-Force Feedback/ Scanning Quantitative Phase Microscopy Technique