Search results
-
-
Title
-
ABSOLUTE DISTANCE (THICKNESS) METROLOGY USING WAVELENGTH SCANNING INTERFEROMETRY
-
Author
-
Suratkar, Amit
-
Date Created
-
2009
-
Subjects--Topical
-
Optics, Optical engineering, Metrology
-
Description
-
Wavelength scanning interferometry offers a new dimension in precision metrology by measuring the cavity length (thickness), the cavity length variation over the cavity area (flatness), and the optical homogeneity within a transparent cavity; with...
-
-
Title
-
DEVELOPMENT OF A VERSATILE HIGH SPEED NANOMETER LEVEL SCANNING MULTI-PROBE MICROSCOPE
-
Author
-
Lin, Feilong
-
Date Created
-
2011
-
Subjects--Topical
-
Mechanical engineering, Engineering
-
Description
-
The motivation for development of a multi-probe scanning microscope, presented in this dissertation, is to provide a versatile measurement tool mainly targeted for biological studies, especially on the mechanical and structural properties of an in...
-
-
Title
-
Effects of Edge Roughness on Optical Scattering from Periodic Microstructures
-
Author
-
Bergner, Brent
-
Date Created
-
2009
-
Subjects--Topical
-
Optics, Nanotechnology
-
Description
-
Planar photonic crystals and other microstructured surfaces have important applications in a number of emerging technologies. However, these structures can be difficult to fabricate in a consistent manner. Rapid, precise measurements of critical p...
