Search results
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Title
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ABSOLUTE DISTANCE (THICKNESS) METROLOGY USING WAVELENGTH SCANNING INTERFEROMETRY
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Author
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Suratkar, Amit
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Date Created
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2009
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Subjects--Topical
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Optics, Optical engineering, Metrology
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Description
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Wavelength scanning interferometry offers a new dimension in precision metrology by measuring the cavity length (thickness), the cavity length variation over the cavity area (flatness), and the optical homogeneity within a transparent cavity; with...
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Title
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FOURIER-BASED IMAGE SHARPNESS SENSOR FOR ADAPTIVE OPTICS CORRECTION
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Author
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Walker, Kristin
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Date Created
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2009
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Subjects--Topical
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Optics
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Description
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Adaptive optics reduces undesirable turbulence effects present during propagation and imaging through the atmosphere or another random medium. Within an adaptive optics system, wavefront sensing determines the incoming wavefront errors. Image shar...
