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Title: ABSOLUTE DISTANCE (THICKNESS) METROLOGY USING WAVELENGTH SCANNING INTERFEROMETRY
Author: Suratkar, Amit
Date Created: 2009
Subjects--Topical: Optics, Optical engineering, Metrology
Description: Wavelength scanning interferometry offers a new dimension in precision metrology by measuring the cavity length (thickness), the cavity length variation over the cavity area (flatness), and the optical homogeneity within a transparent cavity; with...

Title: Intracellular Subsurface Imaging Using a Hybrid Shear-Force Feedback/ Scanning Quantitative Phase Microscopy Technique
Author: Edward, Kert
Date Created: 2009
Subjects--Topical: Optics
Description: Quantitative phase microscopy (QPM) allows for the imaging of translucent or transparent biological specimens without the need for exogenous contrast agents. This technique is usually applied towards the investigation of simple cells such as red b...