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ABSOLUTE DISTANCE (THICKNESS) METROLOGY USING WAVELENGTH SCANNING INTERFEROMETRY
Title
ABSOLUTE DISTANCE (THICKNESS) METROLOGY USING WAVELENGTH SCANNING INTERFEROMETRY
Author
Suratkar, Amit
Date Created
2009
Subjects--Topical
Optics, Optical engineering, Metrology
Description
Wavelength scanning interferometry offers a new dimension in precision metrology by measuring the cavity length (thickness), the cavity length variation over the cavity area (flatness), and the optical homogeneity within a transparent cavity; with...
From Nonradiating Sources to Directionally Invisible Objects
Title
From Nonradiating Sources to Directionally Invisible Objects
Author
Hurwitz, Elisa
Date Created
2017
Subjects--Topical
Optics, Physics
Description
The goal of this dissertation is to extend the understanding of invisible objects, in particular nonradiating sources and directional nonscattering scatterers. First, variations of null-field nonradiating sources are derived from Maxwell's equatio...
Minimizing Task-Specific Uncertainty in CMM-Based Freeform Optics Metrology
Title
Minimizing Task-Specific Uncertainty in CMM-Based Freeform Optics Metrology
Author
Uwakwe, Michael
Date Created
2018
Subjects--Topical
Mechanical engineering, Optics, Metrology
Description
Measurements of surface form involve a comparison between the form of the test surface and a reference. In coordinate measuring machine (CMM) measurements, this reference is the machine geometry. The measurement results typically show a height map...