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IN-SITU MEASUREMENT OF DIMENSIONS AND SURFACE PROFILE OF AXISYMMETRIC OBJECTS USING FRINGE PROJECTION TECHNIQUE
Title
IN-SITU MEASUREMENT OF DIMENSIONS AND SURFACE PROFILE OF AXISYMMETRIC OBJECTS USING FRINGE PROJECTION TECHNIQUE
Author
Farahi, Navid
Date Created
2018
Subjects--Topical
Optics, Physics
Description
Fringe projection technique has been a powerful tool for 3D metrology and surface profilometry with high repeatability. However, for in-situ measurement of objects with highly specular surfaces, large dimensions, and large varying slopes, acquirin...
Instrumented build plate for in-situ stress monitoring and crack detection during the laser powder bed fusion additive manufacturing process
Title
Instrumented build plate for in-situ stress monitoring and crack detection during the laser powder bed fusion additive manufacturing process
Author
Ludwig, Samuel
Date Created
2020
Subjects--Topical
Mechanical engineering, Acoustic emission
Description
The goal of this project is to develop a new method of in-situ monitoring of the laser powder bed fusion (LPBF) additive manufacturing (AM) process. An instrumented build plate was designed, fabricated and installed in the NIST Additive Manufactur...
PERFORMANCE AND SPECIFICATION OF OPTICAL COMPONENTS WITH MID-SPATIAL FREQUENCY SURFACE ERRORS
Title
PERFORMANCE AND SPECIFICATION OF OPTICAL COMPONENTS WITH MID-SPATIAL FREQUENCY SURFACE ERRORS
Author
Aryan, Hamidreza
Date Created
2019
Subjects--Topical
Mechanical engineering, Optics, Engineering
Description
The advent of sub-aperture computer-numerically controlled (CNC) manufacturing techniques has enabled new opportunities for high-performance optical components and systems. Freeform and other challenging designs are now possible like never before....
THE FRACTIONAL BISPECTRUM NOISE REDUCTION TECHNIQUE AND APPLICATIONS IN INTERFEROMETRY
Title
THE FRACTIONAL BISPECTRUM NOISE REDUCTION TECHNIQUE AND APPLICATIONS IN INTERFEROMETRY
Author
Babaie, Jonathan
Date Created
2019
Subjects--Topical
Optics
Description
In the field of optical metrology, there are many existing techniques for measurement of the surface profile or film thickness of a sample of interest. However, many of these common techniques break down when there exists a high level of noise in ...