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DYNAMIC RANGE ENHANCMENT IN DIGITAL FRINGE PROJECTION AND LASER INTERFEROMETRY
Calibrating slope-dependent errors in profilometry
ABSOLUTE DISTANCE (THICKNESS) METROLOGY USING WAVELENGTH SCANNING INTERFEROMETRY
LOW UNCERTAINTY SURFACE AREA MEASUREMENT USING DEFLECTOMETRY
MID-SPATIAL FREQUENCY CHARACTERIZATION AND SPECIFICATION FOR FREEFORM SURFACES USING ZERNIKE POLYNOMIALS
OPTICAL INSTRUMENTATION USING GEOMETRIC PHASE ELEMENTS
THE FRACTIONAL BISPECTRUM NOISE REDUCTION TECHNIQUE AND APPLICATIONS IN INTERFEROMETRY
IN-SITU MEASUREMENT OF DIMENSIONS AND SURFACE PROFILE OF AXISYMMETRIC OBJECTS USING FRINGE PROJECTION TECHNIQUE