Search results
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Title
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ABSOLUTE DISTANCE (THICKNESS) METROLOGY USING WAVELENGTH SCANNING INTERFEROMETRY
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Author
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Suratkar, Amit
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Date Created
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2009
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Subjects--Topical
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Optics, Optical engineering, Metrology
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Description
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Wavelength scanning interferometry offers a new dimension in precision metrology by measuring the cavity length (thickness), the cavity length variation over the cavity area (flatness), and the optical homogeneity within a transparent cavity; with...
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Title
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DYNAMIC RANGE ENHANCMENT IN DIGITAL FRINGE PROJECTION AND LASER INTERFEROMETRY
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Author
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Babaie, Gelareh
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Date Created
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2015
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Subjects--Topical
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Optics, Engineering, Meteorology
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Description
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GELAREH BABAIE. Dynamic range enhancement in digital fringe projection and laser interferometry. (Under the direction of DR. FARAMARZ FARAHI)Optical metrology is the science and technology concerning measurements with light. Surface texture and 3D...
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Title
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LOW UNCERTAINTY SURFACE AREA MEASUREMENT USING DEFLECTOMETRY
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Author
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Pouya Fard, Ali
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Date Created
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2018
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Subjects--Topical
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Optics, Engineering, Metaphysics
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Description
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Deflectometry has been introduced as a viable alternative to interferometric measurement of specular freeform optical surfaces. Deflectometry measurements show high repeatability; however, due to the errors remaining after the calibration and data...