Search results
-
-
Title
-
ABSOLUTE DISTANCE (THICKNESS) METROLOGY USING WAVELENGTH SCANNING INTERFEROMETRY
-
Author
-
Suratkar, Amit
-
Date Created
-
2009
-
Subjects--Topical
-
Optics, Optical engineering, Metrology
-
Description
-
Wavelength scanning interferometry offers a new dimension in precision metrology by measuring the cavity length (thickness), the cavity length variation over the cavity area (flatness), and the optical homogeneity within a transparent cavity; with...
-
-
Title
-
Calibrating slope-dependent errors in profilometry
-
Author
-
Zhou, Yue
-
Date Created
-
2014
-
Subjects--Topical
-
Mechanical engineering, Optics
-
Description
-
Optical profilometers, such as scanning white light interferometers and confocal microscopes, provide high resolution measurements and are widely utilized in many fields for measuring surface topography. The techniques are capable of high-speed su...
-
-
Title
-
DYNAMIC RANGE ENHANCMENT IN DIGITAL FRINGE PROJECTION AND LASER INTERFEROMETRY
-
Author
-
Babaie, Gelareh
-
Date Created
-
2015
-
Subjects--Topical
-
Optics, Engineering, Meteorology
-
Description
-
GELAREH BABAIE. Dynamic range enhancement in digital fringe projection and laser interferometry. (Under the direction of DR. FARAMARZ FARAHI)Optical metrology is the science and technology concerning measurements with light. Surface texture and 3D...
-
-
Title
-
OPTICAL INSTRUMENTATION USING GEOMETRIC PHASE ELEMENTS
-
Author
-
Light, Alyson
-
Date Created
-
2020
-
Subjects--Topical
-
Mechanical engineering, Optics, Engineering
-
Description
-
Traditional optical instrumentation typically requires a controlled, stable environment, and this limits systems to a laboratory setting. For in-situ metrology applications and outdoor measurements, novel methods that are compact and stable are re...