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ABSOLUTE DISTANCE (THICKNESS) METROLOGY USING WAVELENGTH SCANNING INTERFEROMETRY
Title
ABSOLUTE DISTANCE (THICKNESS) METROLOGY USING WAVELENGTH SCANNING INTERFEROMETRY
Author
Suratkar, Amit
Date Created
2009
Subjects--Topical
Optics, Optical engineering, Metrology
Description
Wavelength scanning interferometry offers a new dimension in precision metrology by measuring the cavity length (thickness), the cavity length variation over the cavity area (flatness), and the optical homogeneity within a transparent cavity; with...
Calibrating slope-dependent errors in profilometry
Title
Calibrating slope-dependent errors in profilometry
Author
Zhou, Yue
Date Created
2014
Subjects--Topical
Mechanical engineering, Optics
Description
Optical profilometers, such as scanning white light interferometers and confocal microscopes, provide high resolution measurements and are widely utilized in many fields for measuring surface topography. The techniques are capable of high-speed su...
DYNAMIC RANGE ENHANCMENT IN DIGITAL FRINGE PROJECTION AND LASER INTERFEROMETRY
Title
DYNAMIC RANGE ENHANCMENT IN DIGITAL FRINGE PROJECTION AND LASER INTERFEROMETRY
Author
Babaie, Gelareh
Date Created
2015
Subjects--Topical
Optics, Engineering, Meteorology
Description
GELAREH BABAIE. Dynamic range enhancement in digital fringe projection and laser interferometry. (Under the direction of DR. FARAMARZ FARAHI)Optical metrology is the science and technology concerning measurements with light. Surface texture and 3D...
IN-SITU MEASUREMENT OF DIMENSIONS AND SURFACE PROFILE OF AXISYMMETRIC OBJECTS USING FRINGE PROJECTION TECHNIQUE
Title
IN-SITU MEASUREMENT OF DIMENSIONS AND SURFACE PROFILE OF AXISYMMETRIC OBJECTS USING FRINGE PROJECTION TECHNIQUE
Author
Farahi, Navid
Date Created
2018
Subjects--Topical
Optics, Physics
Description
Fringe projection technique has been a powerful tool for 3D metrology and surface profilometry with high repeatability. However, for in-situ measurement of objects with highly specular surfaces, large dimensions, and large varying slopes, acquirin...
LOW UNCERTAINTY SURFACE AREA MEASUREMENT USING DEFLECTOMETRY
Title
LOW UNCERTAINTY SURFACE AREA MEASUREMENT USING DEFLECTOMETRY
Author
Pouya Fard, Ali
Date Created
2018
Subjects--Topical
Optics, Engineering, Metaphysics
Description
Deflectometry has been introduced as a viable alternative to interferometric measurement of specular freeform optical surfaces. Deflectometry measurements show high repeatability; however, due to the errors remaining after the calibration and data...
OPTICAL INSTRUMENTATION USING GEOMETRIC PHASE ELEMENTS
Title
OPTICAL INSTRUMENTATION USING GEOMETRIC PHASE ELEMENTS
Author
Light, Alyson
Date Created
2020
Subjects--Topical
Mechanical engineering, Optics, Engineering
Description
Traditional optical instrumentation typically requires a controlled, stable environment, and this limits systems to a laboratory setting. For in-situ metrology applications and outdoor measurements, novel methods that are compact and stable are re...
THE FRACTIONAL BISPECTRUM NOISE REDUCTION TECHNIQUE AND APPLICATIONS IN INTERFEROMETRY
Title
THE FRACTIONAL BISPECTRUM NOISE REDUCTION TECHNIQUE AND APPLICATIONS IN INTERFEROMETRY
Author
Babaie, Jonathan
Date Created
2019
Subjects--Topical
Optics
Description
In the field of optical metrology, there are many existing techniques for measurement of the surface profile or film thickness of a sample of interest. However, many of these common techniques break down when there exists a high level of noise in ...