Search results
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Title
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A Novel Fluorescence Based Method of Assessing Subsurface Damage in Optical Materials
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Author
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Williams, Wesley
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Date Created
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2009
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Subjects--Topical
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Mechanical engineering, Materials science, Optics
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Description
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Lapping and polishing are loose abrasive finishing processes that have been used to achieve critical surface parameters in optical materials for centuries. These processes remove material from the surface through a variety of mechanical and chemic...
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Title
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ABSOLUTE DISTANCE (THICKNESS) METROLOGY USING WAVELENGTH SCANNING INTERFEROMETRY
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Author
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Suratkar, Amit
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Date Created
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2009
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Subjects--Topical
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Optics, Optical engineering, Metrology
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Description
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Wavelength scanning interferometry offers a new dimension in precision metrology by measuring the cavity length (thickness), the cavity length variation over the cavity area (flatness), and the optical homogeneity within a transparent cavity; with...
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Title
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Effects of Edge Roughness on Optical Scattering from Periodic Microstructures
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Author
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Bergner, Brent
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Date Created
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2009
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Subjects--Topical
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Optics, Nanotechnology
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Description
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Planar photonic crystals and other microstructured surfaces have important applications in a number of emerging technologies. However, these structures can be difficult to fabricate in a consistent manner. Rapid, precise measurements of critical p...
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Title
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FOURIER-BASED IMAGE SHARPNESS SENSOR FOR ADAPTIVE OPTICS CORRECTION
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Author
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Walker, Kristin
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Date Created
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2009
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Subjects--Topical
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Optics
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Description
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Adaptive optics reduces undesirable turbulence effects present during propagation and imaging through the atmosphere or another random medium. Within an adaptive optics system, wavefront sensing determines the incoming wavefront errors. Image shar...