Spatially Resolved Photoluminescence Lifetime Mapping in the Vicinity of Extended Defects in Semiconductors Using a Time Correlated Single Photon Counting System and Confocal Photoluminescence Microscopy

Mode, T. (2016). Spatially Resolved Photoluminescence Lifetime Mapping in the Vicinity of Extended Defects in Semiconductors Using a Time Correlated Single Photon Counting System and Confocal Photoluminescence Microscopy. Unc Charlotte Electronic Theses And Dissertations.

Analytics

112 views ◎
84 downloads ⇓