Spatially Resolved Photoluminescence Lifetime Mapping in the Vicinity of Extended Defects in Semiconductors Using a Time Correlated Single Photon Counting System and Confocal Photoluminescence Microscopy
Mode, T. (2016). Spatially Resolved Photoluminescence Lifetime Mapping in the Vicinity of Extended Defects in Semiconductors Using a Time Correlated Single Photon Counting System and Confocal Photoluminescence Microscopy. Unc Charlotte Electronic Theses And Dissertations.
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